Georgia Tech: Near-Field Antenna Measurement Techniques

Near-Field Antenna Measurement Techniques

Program ID: ELEC 2002P
Program type: Short Courses (weekday)
CEUs: 2.7

Location/
(Accommodations)

Program Administrator

Start

End

Status

Cost

Hotel Boulderado, Boulder, CO
(Hotel Boulderado, Boulder, CO)

Dr. Edward Joy

June 14, 2010

June 18, 2010

$1,895.00

Section ID: 10114/220411023

NOTES:
-- On the first day, check in at least 30 minutes before the class start time.
-- Discount available for companies that send 3 or more people to this course. Call 404-385-3501 to register your group.

-- Georgia Tech employees should call 404-385-3501 to register by phone, and have their PeopleSoft number ready.

Meeting time(s):
•Monday, June 14, 2010 (8:30 AM-5:00 PM)
•Tuesday, June 15, 2010 (8:00 AM-4:30 PM)
•Wednesday, June 16, 2010 (8:00 AM-4:30 PM)
•Thursday, June 17, 2010 (8:00 AM-4:30 PM)
•Friday, June 18, 2010 (8:00 AM-11:30 AM)

Course Description

Explore the state-of-the-art in near-field antenna measurement techniques. Examine planar surface, cylindrical surface, and spherical surface ranges and near-field probe array ranges, with an overview of the basic theory, procedures, and techniques. Concentrate on basic concepts, procedures, and optimal applications. Measured results demonstrate techniques discussed.

Who Should Attend

Engineers
Scientists
Engineering managers
Project planners
Antenna-measurements technicians
Those new to near-field antenna measurements
Those considering the addition of an antenna measurement facility or an upgrade of an existing facility

How You Will Benefit

Understand planar, cylindrical, and spherical near-field antenna measurement technique theory and applications
Explore mechanical alignment of near-field ranges
Perform probe calibration and gain extrapolation measurements
Perform planar, cylindrical, and spherical near-field antenna measurements
Assess the accuracy of near-field measurement
Mitigate numerous near-field measurement errors and uncertainties
Perform range characterization and compensation measurements
Perform microwave holography measurement and data processing

What You Will Cover

Measurements
Fundamentals of Near-Field Measurements
Planar Surface Ranges
Planar Position Error, Near-Field Gain, and Absorber
Mechanical Aspects of Planar Near-Field
Probe Characterization
Probe Gain Characterization
Cylindrical Surface Ranges
Spherical Surface Ranges
Near-Field Probe Arrays
Near-Field Range Qualification and Certification
Test Planning, Pulse, and High Power Testing
Range Characterization and Compensation
Microwave Holography

Course Materials

Participants receive course notes.

Certificate

This course is an elective for the Antenna Engineering Certificate.

The Instructors

The instructors are some of the original contributors to the theory and technique of near-field measurements, including Georgia Institute of Technology and National Institute of Standards and Technology personnel.

Ed Joy, professor emeritus of electrical and computer engineering, is a Life Fellow of the IEEE and Fellow of the Antenna Measurements Techniques Association. He is the recipient of the 1999 AMTA Distinguished Achievement Award and the 1997 Georgia Tech Continuing Education Award.

Mike Francis (bio forthcoming)

Doug Kremer, range manager and technical lead for a number of the antenna test facilities at Northrop Grumman Corp. in Baltimore, Md, had more than 30 years experience in near-field measurements, range design and installation at NIST, Orbit/FR, MI-Technologies and Northrop Grumman.

Allen Newell, engineering consultant and former division chief of the Electromagnetic Fields Division of National Institute of Standards and Technology, has more than 40 years experience in near-field antenna measurement technique research and development.