Georgia Tech: EO/IR Polarimetric Imaging Systems

EO/IR Polarimetric Imaging Systems

Program ID: DEF 3004P
Program type: Short Courses (weekday)
CEUs: 1.6

Location/
(Accommodations)

Program Administrator

Start

End

Status

Cost

Georgia Tech Global Learning Center
(Georgia Tech Hotel)

Dr. Joseph Accetta

November 2, 2010

November 4, 2010

$1,995.00

Section ID: 10126/220411049

IMPORTANT: This course is restricted to U.S. citizens and all attendees are required to fill out the Access Eligibility Form indicating they meet the attendance requirements.

NOTES:
-- On the first day, check in at least 30 minutes before the class start time.
-- Discount available for companies that send 3 or more people to this course. Call 404-385-3501 to register your group.

-- Georgia Tech employees should call 404-385-3501 to register by phone, and have their PeopleSoft number ready.

Meeting time(s):
•Tuesday, November 2, 2010 (1:30 PM-5:00 PM)
•Wednesday, November 3, 2010 (8:30 AM-5:00 PM)
•Thursday, November 4, 2010 (8:30 AM-5:00 PM)

Course Description

Polarimetric imaging is a form of remote sensing relying on the relative intensity of the polarized components of reflected radiation from natural sources in an uncontrolled environment. Examine the nature of light and the electro-magnetic description of polarization with attention to notations in common use in the literature, including the Stokes vector and the Mueller matrix. Understand basic polarimetric phenomenology regarding the interaction of natural and polarized light with materials and the origins of the imaging process.

Who Should Attend

System analysts
Sensor engineers
Image analysts
Computer scientists involved in algorithm development
Technical procurement decision-makers

How You Will Benefit

Master basic polarimetric phenomenology regarding the interaction of polarized light with materials
Explore the various forms of notation used in polarimetric imagery
Know the various types of polarizing devices
Learn the various forms of polarimetric sensors and the imagery they provide
Identify the critical information embedded in polarized imagery

What You Will Cover

Fundamentals of EM waves, Polarimetric Descriptions
Coherency Matrices/Stokes/Mueller Formalisms
Polarizing Devices
Polarimetric Imagery and Applications
Theoretical Simulation Approaches
Advanced Polarimetric Techniques
Phenomenology
- Sources of Polarization
- Polarization in Nature
Background and History of Polarimetric Imaging Sensors
Polarimetric Sensors - Types and Implementation
Scattering and the Effects of the Atmosphere on Polarimetric Sensing
Characteristics of Polarimetric Imagery including Stokes and Mueller Formats

Course Materials

Participants receive a copy of course notes.

Prerequisites

A two-semester sequence of basic physics typical of most science and engineering curricula is helpful.

Certificate

This course is an elective for the Infrared & Electro-Optical Technology Certificate.

Security Requirements

Participants must be employees of U.S. government agencies or their contractors as well as U.S. citizens. To meet this requirement, you must submit the Access Eligibility Form.

The Instructors

Joseph Accetta, Ph.D., a Georgia Tech Research Institute principal research scientist and director of GTRI's Field Office in Albuquerque, N.M., is a researcher in hyperspectral and polarimetric sensing and has held research and management positions in remote sensing in the military, national laboratory and aerospace sectors including the Environmental Research Institute of Michigan, Los Alamos National Laboratory, and Air Force Research Laboratory. A fellow of the Optical Engineering Society, he is the executive editor and author of the Infrared and Electro-Optics Handbook.

Dennis Goldstein, Ph.D. obtained his BS and MS degrees from the University of Wisconsin - Madison and his Ph.D. in Physics from the University of Alabama in Huntsville. His research interests include polarized light, optical processing, and electro-optic modulators, and he has six patents in these areas. He formerly led the Electro-optics Research Laboratory in the Advanced Guidance Division of the Air Force Research Laboratory in polarization phenomenology investigations. Dr. Goldstein has authored over 60 technical papers, two book chapters, and is author of the book Polarized Light, 2nd edition. He is a Topical Editor of the Journal Applied Optics. Dr. Goldstein is an Adjunct Professor in the College of Optical Sciences at the University of Arizona. He was 2000-2002 Chairman of the Polarization Technical Group of SPIE, has chaired eight SPIE conferences on polarization, and is a Fellow of the SPIE.

J. Scott Tyo, Ph.D., Associate Professor of Optical Sciences at the University of Arizona researches polarimetric and hyperspectral imaging with visible and near infrared light, processing of high-dimensional spectropolarimetric data, investigation of statistical properties of hyperspectral imagery, integration of polarimetric and spectral sensors and information, and the use of spectropolarimetry to improve imaging in scattering media. The author of numerous publications and the recipient of awards including the National Science Foundation Faculty Early Career Award and UNM Outstanding Researcher Award, he has previously served on the staffs of the Naval Postgraduate School and the U.S. Air Force Research Lab. He has taught courses in spectral imagery, discrete-time signal processing and modern spectral estimation.