Georgia Tech: Far-Field, Anechoic Chamber, Compact and Near-Field Antenna Measurements

Far-Field, Anechoic Chamber, Compact and Near-Field Antenna Measurements

Program ID: ELEC 2003P
Program type: Short Courses (weekday)
CEUs: 2.8

Location/
(Accommodations)

Program Administrator

Start

End

Status

Cost

Georgia Tech Global Learning Center
(Georgia Tech Hotel)

Dr. Edward Joy

November 15, 2010

November 19, 2010

$1,895.00

Section ID: 10115/220411051

NOTES:
-- On the first day, check in at least 30 minutes before the class start time.
-- Discount available for companies that send 3 or more people to this course. Call 404-385-3501 to register your group.

-- Georgia Tech employees should call 404-385-3501 to register by phone, and have their PeopleSoft number ready.

Meeting time(s):
•Monday, November 15, 2010 (8:30 AM-4:30 PM)
•Tuesday, November 16, 2010 (8:00 AM-4:00 PM)
•Wednesday, November 17, 2010 (8:00 AM-4:00 PM)
•Thursday, November 18, 2010 (8:00 AM-6:00 PM)
•Friday, November 19, 2010 (8:00 AM-11:30 AM)

Course Description

Master the state-of-the-art far-field, anechoic chamber, compact, and near-field measurements. Learn antenna measurement facility characterization and compensation techniques and microwave holography. Examine theory and optimal application of each technique. Concentrate on basic concepts, design, procedures, and application. Focus on antenna measurements in the HF, VHF, UHF, microwave, and millimeter-wave frequency ranges. Visit MI Technologies compact range and demonstration facilities.

Who Should Attend

Engineers
Scientists
Engineering managers
Practicing antenna measurement technicians

How You Will Benefit

Understand the theory of antenna measurement on a variety of antenna measurement facilities
Measure gain, directivity, efficiency, effective area and polarization of an antenna
Measure far-field patterns on far-field, anechoic chamber, compact and near-field antenna measurement facilities
Determine the accuracy level of antenna measurement facilities
Compensate antenna measurement facilities for non-ideal test zone fields
Perform microwave holography to learn the fields on the surface of an antenna or radome

What You Will Cover

Basic Principles of Antenna Measurement
Far-Field Antenna Measurement
Gain, Directivity, and Efficiency Measurement
Polarization Measurement
Antenna Measurement Instrumentation
Anechoic Chamber Measurement
Compact Antenna Measurement
Planar Near-Field Measurement
Cylindrical Near-Field Measurement
Spherical Near-Field Measurement
Near-Field Probe Arrays
Test Facility Characterization and Compensation
Microwave Holography
Tour of MI Technologies Compact Range and Demonstration Facilities

Course Materials

Participants receive a notebook with the lecture notes.

Certificate

This course is an elective for the Antenna Engineering Certificate.

Hotel Accommodations

Hotel accommodations may be available at several hotels near the Georgia Tech Global Learning Center, including the Georgia Tech Hotel, which is attached to our facility. Click here to view a list.

The Instructors

Don Bodnar, vice president of MI Technologies, former chief engineer at the U.S. Air Force Rome Laboratory, and member of Georgia Tech Research Institute's research faculty, has more than 35 years of experience in antenna and antenna measurement research.

Doren Hess, senior staff engineer at MI Technologies, former executive vice president of Aeroflex Lintech Corp., and former principal engineer at Scientific Atlanta Inc., has more than 30 years of experience in antenna and radar cross-section measurement research and development.

Ed Joy, professor emeritus of electrical and computer engineering, is a Life Fellow of the IEEE and Fellow of the Antenna Measurements Techniques Association. He is the recipient of the 1999 AMTA Distinguished Achievement Award and the 1997 Georgia Tech Continuing Education Award.